Tutorials detailed

T1.2 - Infrared Spectroscopy for Sensors: Trends and Developments
W. Mäntele, Goethe Universität Frankfurt, Frankfurt am Main (Germany)

Infrared spectroscopy has long been established as a standard technique in chemical laboratories and is known for high molecular specificity and selectivity. With novel infrared light sources such as quantum cascade lasers (QCL), new detection technologies, and optics, IR spectroscopy can form the basis for compact and mobile sensor applications for gases and liquids. This tutorial starts from basic knowledge about spectroscopy and leads to advanced infrared sensor applications in biotechnology and medicine. Examples are sensors for reagent-free blood and urin analysis and for non-invasive blood glucose determination for diabetes patients. As an example from biotechnology, an infrared-based beer sensor will be presented.

T1.3 - Spectral Imaging for Non-invasive Material Characterisation and Mapping
R. Gloaguen, M. Fuchs, S. Lorenz, A. Afifi, Helmholtz-Institute Freiberg for Resource Technology, Freiberg (Germany)

Light reflected or emitted from a natural surface contains material-characteristic, spectral signatures. Spectral imaging sensors can capture this information in data rasters containing hundreds of discrete spectral bands. The resulting spectral data cube can be analyzed to create detailed maps of the surfaces’ material composition. Spectral imaging is experiencing rapid transformation, mostly due to the ongoing miniaturization of sensors, the boost in computer processing power and the need for fast and non-invasive characterization technologies. The technology is versatile with regards to application type and scale, and can be applied in controlled environments as well as under sunlight illumination. Spectral imaging already supports a variety of application fields in Earth observation and industry, such as agriculture, geoscience, urban planning, recycling and environmental monitoring, ranging from global down to sample scale. Within this tutorial, we will introduce the participants to the basics of spectral imaging, showcase state-of-the-art workflow developments, and highlight innovative application fields. The tutorial will be structured in four sections:

• General introduction of spectral imaging as innovative technique in science and industry, with focus on innovative applications and integration into larger    
  frameworks (Richard Gloaguen)
• Sensor technology and multi-sensor integration, with focus on industrial material streams (Margret Fuchs)
• Challenges in data correction and processing, with focus on multi-scale “outdoor” acquisition (Sandra Lorenz)
• Introduction to ML/DL for real-time mapping, 3D mapping using spectral data (Ahmed Afifi)

T2.2 - Essentials of Finite Element Simulations for MEMS
D. Platz, Technische Universität Wien, Vienna (Austria)

The finite element method (FEM) is one of the most important tools for modelling microelectromechanical systems (MEMS). Today, most engineers use commercial FEM software packages in the development of MEMS sensors and actuators. The useability of such commercial FEM software packages has reached a level at which performing FEM simulations does not require an extensive mathematical background. In fact, the actual computations often remain elusive, making it difficult for many users to assess the quality of simulation results. In this tutorial, we provide the essential knowledge required for the competent use of FEM software with a focus on MEMS. In the first part of the tutorial, we review the basics of elasticity theory to understand how deformations of MEMS are described. We discuss the physical interpretation of stress and strain, leading to the formulation of the fundamental partial differential equations (PDEs), which underlay the modelling process. In the second part, we discuss how the finite element method can be used to solve these PDEs numerically. We rewrite the PDEs in a suitable form for a straight forward discretization and introduce the notion of a mesh. We define what finite elements are and how different types of finite elements are required for different types of problems. After the tutorial, participants will better understand the main concepts of the finite element method and will be more competent users of FEM software.

T2.3 - The quantum revolution 2.0: a short trip in the world of quantum sensors (with a special focus on photons)
I. Degiovanni, Italian National Institute of Metrology Research, Torino (Italy)

The second quantum revolution is underway and the deployment of Quantum Technologies keeps pace with it. This technological paradigm-switch creates opportunities and challenges for industry, innovation and society. Several large companies, as well as start-ups, have started to develop and engineer quantum devices or begun to integrate them into their products: the commercial success of quantum technologies, together with progress in research and development, relies on certification and reliability built upon internationally agreed standards and metrological traceability.

In this talk after a general introduction on most of the different technology platforms around which quantum sensors are built, there will be a special focus on the single-photon detectors as quantum sensors of quantized light. Single-photon detectors appear to be a pervasive solution in the context of quantum technologies, not limited to the quantum sensing world, for this reason it is important to understand their inefficiencies, non-ideal behavior and limitations.

T3.1 - Sensors and Analytics for Safety and Process Control in Hydrogen Technologies
C. Tiebe, Bundesanstalt für Materialforschung und -prüfung, Berlin (Germany)

Sensor and instrumented analytical systems are widely used in hydrogen technologies. This tutorial presents requirements and properties of sensor systems and shows application examples of these technologies for safety and process control for hydrogen technologies. The focus is on gas sensors as well as sensors for pressure, temperature and gas flow. These systems are applied, among other things, for monitoring and control of operating conditions, indication of hazardous conditions and triggering of alarms.